Single view metrology
- 1 January 1999
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 1, 434-441 vol.1
- https://doi.org/10.1109/iccv.1999.791253
Abstract
We describe how 3D affine measurements may be computed from a single perspective view of a scene given only minimal geometric information determined from the image. This minimal information is typically the vanishing line of a reference plane and a vanishing point for a direction not parallel to the plane. It is shown that affine scene structure may then be determined from the image, without knowledge of the camera's internal calibration (e.g. focal length), nor of the explicit relation between camera and world (pose). In particular we show how to: compute the distance between planes parallel to the reference plane (up to a common scale factor); compute area and length ratios on any plane parallel to the reference plane; determine the camera's (viewer's) location. Simple geometric derivations are given for these results. We also develop an algebraic representation which unifies the three types of measurement and, amongst other advantages, permits a first order error propagation analysis to be performed, associating an uncertainty with each measurement. We demonstrate the technique for a variety of applications, including height measurements in forensic images and 3D graphical modelling from single images.Keywords
This publication has 8 references indexed in Scilit:
- Vanishing point calculation as a statistical inference on the unit spherePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Metric rectification for perspective images of planesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Creating Architectural Models from ImagesComputer Graphics Forum, 1999
- A plane measuring deviceImage and Vision Computing, 1999
- Planar homologies as a basis for grouping and recognitionImage and Vision Computing, 1998
- Tour into the picturePublished by Association for Computing Machinery (ACM) ,1997
- Vanishing point detection by line clusteringPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1995
- Geometry IIPublished by Springer Nature ,1987