High resolution electron microscopy of amorphous thin films
- 1 December 1978
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 31 (1-2) , 41-55
- https://doi.org/10.1016/0022-3093(78)90098-4
Abstract
No abstract availableThis publication has 28 references indexed in Scilit:
- Scattering Properties of Dense Random Packings of Hard SpheresPhysica Status Solidi (b), 1976
- Effect of spatial frequency on the visibility of unstructured patternsJournal of the Optical Society of America, 1976
- Anisotropy of structural models for amorphous materialsPhysical Review B, 1976
- The imaging of amorphous specimens in a tilted-beam electron microscopeJournal of Physics C: Solid State Physics, 1975
- Kinematical theory of images from polycrystalline and random-network structuresJournal of Applied Crystallography, 1975
- A Scanning Electron Diffraction Study of Vapor‐Deposited and Ion Implanted Thin Films of Ge (II)Physica Status Solidi (b), 1973
- Electrical and Structural Properties of Amorphous GermaniumPhysical Review B, 1973
- Theory of Electron Micrographs of Amorphous MaterialsPhysical Review B, 1973
- Interpreting electron micrographs of amorphous solidsJournal of Physics C: Solid State Physics, 1973
- Coherent Scattering in a Random-Network Model for Amorphous SolidsPhysical Review Letters, 1972