Determination of optical constants of solids by an automatic reflectometer

1 June 1988

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement

Vol. 37 (2) , 296-299
https://doi.org/10.1109/19.6070

Abstract

[[abstract]]An absolute reflectance spectrometer was designed. The instrument is based on an Apple II microcomputer which automates data acquisition, curve fitting, Kramers-Kronig integration, and data plotting. In this system, both the positions of the sample and the detectors are fixed during measurement. The reference and sample signals are detected by scanning a mirror which is engaged with a precise stepping motor. The computer controls all the peripheral instruments; therefore the need of continuous attention to the gain control, frequency scanning, and mirror adjustment is eliminated. Versatile software allows the collected data to be easily manipulated and analyzed[[fileno]]2010122010049[[department]]物理

Keywords

This publication has 0 references indexed in Scilit: