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Design to Test
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Design to Test
Design to Test
JT
Jon L. Turino
Jon L. Turino
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1 January 1990
book
Published by
Springer Nature
https://doi.org/10.1007/978-94-011-6044-5
Abstract
No abstract available
Keywords
ASIC
COUNTER
HARDWARE
LSI
VLSI
DIGITAL SIGNAL PROCESSOR
HARDWARE DESIGN
INTERCONNECT
MICROPROCESSOR
SEMICONDUCTOR
TESTING
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