RFLP analysis of an Aegilops ventricosa chromosome that carries a gene conferring resistance to leaf rust (Puccinia recondita) when transferred to hexaploid wheat

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Abstract
RFLP analysis has been used to characterise XMv, a chromosome of Aegilops ventricosa present in a disomic addition line of wheat. This chromosome is known to carry a major gene conferring resistance to leaf rust (Lr). The analysis demonstrated that XMv is translocated with respect to the standard wheat genome, and consists of a segment of the short arm of homoeologous group 2 attached to a group 6 chromosome lacking a distal part of the short arm. Lr was located to the region of XMv with homoeology to 2S by analysis of a leaf rust-susceptible deletion line that was found to lack the entire 2S segment. Confirmation and refinement of the location of Lr was obtained by analysis of a spontaneous resistant translocation in which a small part of XMv had been transferred to wheat chromosome 2A.