Estimation of surface roughness parameters from dual-frequency measurements of radar backscattering coefficients
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Geoscience and Remote Sensing
- Vol. 26 (5) , 574-579
- https://doi.org/10.1109/36.7682
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- The Effects of Soil Moisture, Surface Roughness, and Vegetation on L-Band Emission and BackscatterIEEE Transactions on Geoscience and Remote Sensing, 1987
- The SIR-B Observations of Microwave Backscatter Dependence on Soil Moisture, Surface Roughness, and Vegetation CoversIEEE Transactions on Geoscience and Remote Sensing, 1986
- Calculations of radar backscattering coefficient of vegetation-covered soilsRemote Sensing of Environment, 1984
- Radar Backscattering Properties of Corn And Soybeans at Frequencies of 1.6, 4.75, And 13.3 GHzIEEE Transactions on Geoscience and Remote Sensing, 1983
- A Simple Relation between Active And Passive Microwave Remote Sensing Measurements of Earth TerrainIEEE Transactions on Geoscience and Remote Sensing, 1982
- An Empirical Model for the Complex Dielectric Permittivity of Soils as a Function of Water ContentIEEE Transactions on Geoscience and Remote Sensing, 1980
- Microwave Backscatter Dependence on Surface Roughness, Soil Moisture, and Soil Texture: Part I-Bare SoilIEEE Transactions on Geoscience Electronics, 1978