Cd 1−x Mn x Te magneto-optical waveguide integrated on GaAs substrate

The refractive indices of diluted magnetic semiconductor ${\mathrm{Cd}}_{\text{1−x}}{\mathrm{Mn}}_x\mathrm{Te}$ films on sapphire substrates have been determined by m-line spectroscopy to precision 0.001 at the wavelengths λ=670, 785, and 1150 nm. Using these data, we designed double-layer ${\mathrm{Cd}}_{\text{1−x}}{\mathrm{Mn}}_x\mathrm{Te}$ structures on a GaAs substrate, achieving the integration of the magneto-optical waveguide on a semiconductor substrate. Good optical confinement of the waveguide mode was confirmed.