Selectable Length Partial Scan: A Method to Reduce Vector Length
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- On automatic testpoint insertion in sequential circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Scan design at NECIEEE Design & Test of Computers, 1989
- Designing circuits with partial scanIEEE Design & Test of Computers, 1988
- SMART And FAST: Test Generation for VLSI Scan-Design CircuitsIEEE Design & Test of Computers, 1986