Dispersion of the refractive index and chemical composition of SiOx films
- 1 August 1979
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 61 (3) , 391-395
- https://doi.org/10.1016/0040-6090(79)90485-1
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
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- Behavior of the Electronic Dielectric Constant in Covalent and Ionic MaterialsPhysical Review B, 1971
- Optical properties of non-crystalline Si, SiO, SiOx and SiO2Journal of Physics and Chemistry of Solids, 1971
- Optical Properties of Silicon Monoxide in the Wavelength Region from 024 to 140 Microns*Journal of the Optical Society of America, 1954