X-ray detection characteristics of microchannel plates using synchrotron radiation in the energy range from 0.06 to 0.6 keV

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Abstract
The characteristics of microchannel plates (MCPs) for x‐ray detection have been investigated with continuous x‐ray energy variation using synchrotron radiation in the XUV and soft x‐ray region (from 60 to 600 eV). The current response data have shown x‐ray absorption fine structure (EXAFS or XANES) near the oxygen K absorption edge as well as a jump structure near the silicon L edge; these structures are explained by the surface composition of channel walls (SiO2). The data show that the surface layer of a microchannel is essential for x‐ray detection by MCPs in this energy range. The precise current response curve has been completed for the wide x‐ray energy range from 0.06 to 82 keV combined with the previously reported data [Kondoh et al., Rev. Sci. Instrum. 59, 252 (1988); Cho et al., ibid. 59, 2453 (1988); Yamaguchi et al., ibid. 60, 368, 2307 (1989)].