High-Voltage Damage and Low-Frequency Noise in Thick-Film Resistors
- 1 December 1976
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Parts, Hybrids, and Packaging
- Vol. 12 (4) , 351-356
- https://doi.org/10.1109/tphp.1976.1135152
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- On the Interpretation of Noise in Thick-Film ResistorsIEEE Transactions on Parts, Hybrids, and Packaging, 1976
- Thick Film Resistors with Improved Voltage StabilityIEEE Transactions on Parts, Hybrids, and Packaging, 1974
- Proof of basic semiconductor flicker noise formulaeSolid-State Electronics, 1974
- Electrical Transport Properties of Irand RuPhysical Review B, 1970
- 1/⨍ noise in continuous thin gold filmsPhysica, 1969
- 1/ƒ noise is no surface effectPhysics Letters A, 1969