Stability in Electrical Properties of Ultra Thin Tin Oxide Films
- 1 January 2000
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Texture Morphology of SnO2:F Films and Cell ReflectanceJapanese Journal of Applied Physics, 1988
- Coating of glass by chemical vapor depositionThin Solid Films, 1981
- Mechanism of CVD Thin Film SnO2 FormationJournal of the Electrochemical Society, 1978