Determination of the growth mechanism of overlayers on solid surfaces: a method based on combined XPS and LEIS measurements
- 1 July 1991
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 51 (1-2) , 89-93
- https://doi.org/10.1016/0169-4332(91)90064-q
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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