Accelerated ageing with in situ electrical testing: A powerful tool for the building‐in approach to quality and reliability in electronics
- 1 January 1994
- journal article
- research article
- Published by Wiley in Quality and Reliability Engineering International
- Vol. 10 (1) , 15-26
- https://doi.org/10.1002/qre.4680100106
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Industrial Perspective on Reliability of VLSI DevicesMRS Proceedings, 1991
- Evolution of VLSI Reliability Engineering8th Reliability Physics Symposium, 1990
- Arrhenius and electronics reliabilityQuality and Reliability Engineering International, 1989
- Activation energies and the arrhenius equationQuality and Reliability Engineering International, 1985