Studies of supported metal catalysts using high resolution secondary electron imaging in a STEM
- 1 July 1987
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 147 (1) , 65-74
- https://doi.org/10.1111/j.1365-2818.1987.tb02818.x
Abstract
SUMMARY: An additional technique for use in the characterization of catalysts by electron microscopy is presented. High resolution secondary electron images obtained in a VG HB501 scanning transmission electron microscope have been used to study the surface topography of catalysts consisting of small metal particles on high surface area carbon supports. Surface features down to nanometre dimensions can be seen, allowing the examination of micropores in the support as well as larger pore structures. The results are compared with pore size distributions determined by gas adsorption methods, and are shown to yield valuable additional information. In addition, the method in principle allows examination of the locations of small metal catalyst particles on the support.Keywords
This publication has 7 references indexed in Scilit:
- Secondary electron detection in the scanning transmission electron microscopeUltramicroscopy, 1985
- Characterization of supported catalysts by high-resolution stemJournal of Molecular Catalysis, 1983
- High resolution electron microscopy and microanalysisContemporary Physics, 1982
- New imaging methods for catalyst particlesUltramicroscopy, 1982
- Study of supported ruthenium catalysts by STEMJournal of Microscopy, 1981
- The ultrastructure of carbons, catalytically active graphitic compounds and zeolitic catalystsPhilosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1981
- Z contrast of platinum and palladium catalystsPhilosophical Magazine A, 1978