Reflectometry by means of optical-coherence modulation
- 26 October 1989
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 25 (22) , 1503-1505
- https://doi.org/10.1049/el:19891009
Abstract
Novel reflectometry with millimetre or submillimetre spatial resolution is proposed to evaluate optical components or circuits. The optical coherence is modulated to have a periodic delta-function shape along the optical path, and the backscattering intensity is obtained directly. The experiment demonstrates a resolution of about 10 mm in air with a Fabry-Perot laser diode.Keywords
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