Measurement of tunneling current through Al/polyimide Langmuir–Blodgett film/Al structure
- 1 May 1994
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 75 (9) , 4557-4559
- https://doi.org/10.1063/1.355949
Abstract
The dc conduction properties of Al/polyimide Langmuir–Blodgett (LB) film/Al structure are reported. The current-voltage characteristics and the temperature dependence of the current are measured and compared with expectation from a tunneling theory, which takes natural oxide of aluminum into consideration. It is concluded that the conduction in the structure with five- or seven-layered LB film is predominantly by direct tunneling of electrons.This publication has 13 references indexed in Scilit:
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