Oscillator performance from the time evolution ofrelative phase
- 20 January 1994
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 30 (2) , 149-151
- https://doi.org/10.1049/el:19940090
Abstract
An improved method is described for simultaneously evaluating the fractional frequency stability and phase noise spectrum of ultrastable microwave oscillators from a digitised recording of a zero Hertz beat waveform between two such oscillators. To illustrate the new technique results are presented from a study of two ultrastable cryogenic sapphire oscillators which have a fractional frequency stability near 10-15 at 1s integration time.Keywords
This publication has 2 references indexed in Scilit:
- Measurement of Frequency Stability in Time and Frequency Domains via Filtering of Phase NoiseIEEE Transactions on Instrumentation and Measurement, 1974
- Characterization of Frequency StabilityIEEE Transactions on Instrumentation and Measurement, 1971