Scaling behavior of YBa2Cu3O7−δ thin-film weak links

Abstract
The superconductive weak link properties of microbridges formed in c‐axis normal YBa2Cu3O7−δ polycrystalline thin films containing a variable amount of large angle tilt boundaries have been studied. In the low critical current density limit these weak links have current‐voltage (IV) characteristics that are accurately modeled by the resistively shunted junction model. The IV’s are found to accurately follow a simple scaling law with the product of the critical current and weak link resistance Rn varying linearly with the weak link conductance.