X‐Ray Fluorescence for Coating Thickness Measurement
- 1 April 1983
- journal article
- Published by Emerald Publishing in Circuit World
- Vol. 10 (1) , 20-25
- https://doi.org/10.1108/eb045973
Abstract
The X‐Ray fluorescence method of coating thickness measurement of ISO 3497, BS 5411 (A), DIN 50987, and ASTM B568–79 is discussed from a practical point of view. A brief illustration of the method's technical principles, advantages, applications, and example instrumentation is given together with some of the precautions to be taken.Keywords
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