Theory of non-steady-state interfacial thermal currents in MOS devices, and the direct determination of interfacial trap parameters
- 28 February 1974
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 17 (2) , 125-130
- https://doi.org/10.1016/0038-1101(74)90060-4
Abstract
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