A new ellipsometric method for measurements on surfaces and surface layers
- 29 February 1980
- journal article
- Published by Elsevier in Materials Science and Engineering
- Vol. 42, 65-69
- https://doi.org/10.1016/0025-5416(80)90012-9
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Visualization Principles in Thin-Layer Immunoassays (TIA) on Plastic SurfacesInternational Archives of Allergy and Immunology, 1976