Measurement of Stress Induced Birefringence of Bi12GeO20 Single Crystals by a New Ellipsometry
- 1 January 1987
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 26 (S2)
- https://doi.org/10.7567/jjaps.26s2.152
Abstract
Optical qualities of Bi12GeO20 single crystals with facets are determined. A facet has higher absorbance and larger refractive index by 3×10-4 than those of off facet. Stress induced birefringence and extinction ratio are examined by a new ellipsometry for evaluating an optical active birefringent medium. Birefringence exists around {110} facet, the maximum retardation reaches 4 degrees per 1 mm thickness. Light is scatterd at the {110} facet boundary, and extinction ratio reaches -35 dB at the maximum point. On the contrary, the extinction ratio inside the facet and off-facet region is under -45 dB.Keywords
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