Aluminum Ion Diffusion in Aluminum Oxide

Abstract
The self‐diffusion coefficient of aluminum has been determined in polycrystalline aluminum oxide over the range 1670° to 1905°C. Diffusion couples were employed using aluminum‐26 in oxide form as a radioactive tracer. In the temperature range studied, experimental data can be represented by D = 28 exp {—[(114 000±15 000)/RT]}.

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