Microvisualization of Structural Features and Ion Electroinsertion Behavior of Patterned WO[sub 3] Thin Films via Integrated Optical and Atomic Force Microscopies
- 1 January 1999
- journal article
- Published by The Electrochemical Society in Electrochemical and Solid-State Letters
- Vol. 2 (10) , 497-500
- https://doi.org/10.1149/1.1390882
Abstract
A new approach for the study of electroinsertion of ions into thin films is presented which utilizes a combination of optical (epi fluorescence) and atomic force microscopies, along with electrochemical techniques. We demonstrate that differential ion/charge transfer reactivity can be temporally and spatially imaged and subsequently correlated with structural characteristics. ©1999 The Electrochemical SocietyKeywords
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