The use of X-ray and neutron reflectometry for the investigation of polymeric thin films
- 7 August 1991
- journal article
- Published by Elsevier in Physica B: Condensed Matter
- Vol. 173 (1-2) , 35-42
- https://doi.org/10.1016/0921-4526(91)90032-a
Abstract
No abstract availableKeywords
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