A MEASUREMENT OF THE 1s2p3PlLIFETIME IN HELIUM LIKE SILICON

Abstract
We have observed the soft X-ray spectrum of highly ionised silicon and made measurements of the 1s2p3P1 lifetime of the helium like system. Standard beam foil decay curve techniques were used and the 3P1 decay to the ground state was observed with a curved crystal X-ray spectrometer. A preliminary result of 6.68 ± 0.40 ps was obtained which compares with theoretical estimates of 6.33 ps and 6.62 ps

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