Fast scanning tunneling microscope for dynamic observation
- 1 April 1990
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 61 (4) , 1342-1343
- https://doi.org/10.1063/1.1141189
Abstract
A fast scanning tunneling microscope (FSTM) is developed using a new method of compensating for the probe tip servo error in constant current mode. The compensation value is derived from the ratio of tunnel current fluctuation to tunnel current (ΔI/I) in a differential tunnel current equation. Dynamic video images of Si(111) adatomic structures taken using the FSTM prove that this method is effective for fast scanning.Keywords
This publication has 6 references indexed in Scilit:
- Observation of p n junctions on implanted silicon using a scanning tunneling microscopeApplied Physics Letters, 1988
- Development of a practical scanning tunneling microscope(STM) and surface observations.Journal of the Japan Society for Precision Engineering, 1988
- Imaging in real time with the tunneling microscopeApplied Physics Letters, 1986
- Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffractionSurface Science, 1985
- 7 × 7 Reconstruction on Si(111) Resolved in Real SpacePhysical Review Letters, 1983
- Generalized Formula for the Electric Tunnel Effect between Similar Electrodes Separated by a Thin Insulating FilmJournal of Applied Physics, 1963