Technical improvements of Scanning Electron Microscope methods in document examination
- 30 September 1983
- journal article
- Published by Elsevier in Forensic Science International
- Vol. 22 (2-3) , 265-278
- https://doi.org/10.1016/0379-0738(83)90023-3
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Examination of Line Crossings by Scanning Electron MicroscopyJournal of Forensic Sciences, 1979
- A Technique for the Detection of Alterations to a Document from a Carbonless Copying SystemJournal of the Forensic Science Society, 1977