A static-SIMS study of thin nickel film on copper substrate
- 1 January 1983
- journal article
- Published by Elsevier in Surface Science
- Vol. 124 (1) , 297-304
- https://doi.org/10.1016/0039-6028(83)90351-5
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- A static-sims study on preferential sputtering on copper-nickel alloy surfaceSurface Science, 1981
- Sims investigations on the diffusion of Cu in Ag single crystalsActa Metallurgica, 1980
- Low energy ion impact phenomena on single crystal surfacesSurface Science, 1978
- Ion beam sputtering - the effect of incident ion energy on atomic mixing in subsurface layersRadiation Effects, 1974
- Implications in the use of secondary ion mass spectrometry to investigate impurity concentration profiles in solidsRadiation Effects, 1973
- Beobachtung von oberflächenreaktionen mit der statischen methode der sekundärionen-massenspektroskopie. I die methodeSurface Science, 1971
- Die Analyse monomolekularer FestkörperoberflÄchenschichten mit Hilfe der SekundÄrionenemissionThe European Physical Journal A, 1970
- Mercury Ion Beam Sputtering of Metals at Energies 4–15 kevJournal of Applied Physics, 1961