Accurate Measurement of the Exciton Diffusion Length in a Conjugated Polymer Using a Heterostructure with a Side-Chain Cross-Linked Fullerene Layer

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1 June 2005

journal article
research article
Published by American Chemical Society (ACS) in The Journal of Physical Chemistry A

Vol. 109 (24) , 5266-5274
https://doi.org/10.1021/jp0509663

Abstract

Exciton diffusion and photoluminescence quenching in conjugated polymer/fullerene heterostructures are studied by time-resolved photoluminescence. It is observed that heterostructures consisting of a spin-coated poly(p-phenylene vinylene) (PPV)-based derivative and evaporated C₆₀ are ill-defined because of diffusion of C₆₀ into the polymer, leading to an overestimation of the exciton diffusion length. This artifact is resolved by the use of a novel, thermally side-chain polymerizing and cross-linking fullerene derivative (F2D) containing two diacetylene moieties, forming a completely immobilized electron acceptor layer. With this heterostructure test system, an exciton diffusion length of 5 ± 1 nm is derived for this PPV derivative from time-integrated luminescence quenching data.

Keywords

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