Optical properties of thin lead films in the energy range 3-15.5 eV evaporated and studied in ultrahigh vacuum
- 15 December 1973
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 8 (12) , 5452-5455
- https://doi.org/10.1103/physrevb.8.5452
Abstract
Reflectance measurements, in situ, on freshly deposited thin lead films are carried out in the far uv. Optical constants and other useful functions such as , , , are deduced. The existence of volume and surface plasmons is demonstrated. The structure of is attributed to interband transitions both at critical points and between parallel bands; for the latter there is reasonable agreement between the experimental data and Ashcroft's calculation.
Keywords
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