Recombination of close frenkel defects in gold

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Abstract
The occurrence of close-vacancy-interstitial-pairs in electron-irradiated gold and the annealing temperature of this type of defect have been investigated by means of “sub-threshold” irradiations. Different samples have been irradiated with 3 MeV electrons at five different temperatures between 7.5°K and 36°K. These samples containing Frenkel defects have then been irradiated at 12°K with 1.2 MeV electrons. This energy is less than the threshold for defect production. During the sub-threshold irradiation, defect annihilation rates have been measured which depend strongly on the temperature at which the defects had been produced. For 7.5°K and 12°K they are of the same order of magnitude as were found in Al, Cu, Pt, and Ta, and were ascribed to recombination of closevacancy-interstitial-pairs. For defects produced at 22°K the annihilation rate is smaller by one order of magnitude and even smaller for defects produced at still higher temperatures. It is concluded from this that close-pairs become thermally unstable in gold between 12 and 22°K.