A built-in self-test for ADC and DAC in a single-chip speech CODEC
- 30 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 791-796
- https://doi.org/10.1109/test.1993.470623
Abstract
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This publication has 4 references indexed in Scilit:
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- Design for testability of mixed signal integrated circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Built-in self-test in a 24 bit floating point digital signal processorPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Fast embedded A/D converter testing using the microcontroller's resourcesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002