Structural characterization of bis-[triethoxysilylpropyl]tetrasulfide and bis-[trimethoxysilylpropyl]amine silanes by Fourier-transform infrared spectroscopy and electrochemical impedance spectroscopy
- 1 January 2002
- journal article
- Published by Taylor & Francis in Journal of Adhesion Science and Technology
- Vol. 16 (9) , 1235-1260
- https://doi.org/10.1163/156856102320256873
Abstract
Bis-[triethoxysilylpropyl]tetrasulfide (or bis-sulfur silane) and bis-[trimethoxysilylpropyl] amine (or bis-amino silane) were deposited on 2024-T3 aluminum alloy (AA 2024-T3). The structures of th...Keywords
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