External Fields from Domain Walls of Cobalt Film

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Abstract
By scanning the surface with a Hall probe, domain patterns on thin cobalt films have been mapped by measuring the fringing flux normal to the film surface. The samples studied were cobalt approximately 2000A thick. At the domain boundaries, peak fields ranged in intensity from less than 0.5 to 4.5 oe. The probe to film gap was 13 μ. The sensitive area of the probe was a square of bismuth 20 μ on a side. It was observed that along specific boundaries, reversal of flux direction occurs. The boundaries exhibiting low peak fields were generally parallel to the easy direction of magnetization, whereas the boundaries exhibiting high fields were skewed relative to the easy direction of magnetization. Kerr effect and Hall probe patterns for the same domain configuration are shown to agree.

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