Study and applications of channelled-electron-induced localized X-ray emission
- 1 April 1989
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 28 (1-4) , 61-64
- https://doi.org/10.1016/0304-3991(89)90271-4
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Channeling effects from impurity atoms in the high-angle annular detector of the stemUltramicroscopy, 1988
- Atomic site and species determinations using channeling and related effects in analytical electron microscopyUltramicroscopy, 1988
- Study of static atomic displacements by channelled-electron-beam-induced X-ray emission: Application to In0.53Ga0.47As alloysPhilosophical Magazine A, 1987
- Localization and ALCHEMI for zone axis orientationsUltramicroscopy, 1987
- Pendellösung radiation and coherent BremsstrahlungActa Crystallographica Section A Foundations of Crystallography, 1986
- Crystallographic structure of ternary semiconducting alloysSolid State Communications, 1985
- The measurement of impact parameters by crystallographic orientation effects in electron scatteringPhilosophical Magazine A, 1984
- Extended x-ray-absorption fine-structure study ofrandom solid solutionsPhysical Review B, 1983
- Structure-Factor Phase Information from Two-Beam Electron DiffractionPhysical Review Letters, 1983
- Study of single-electron excitations by electron microscopy I. Image contrast from delocalized excitationsPhilosophical Magazine A, 1978