Multiple distributions for biased random test patterns
- 1 June 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 9 (6) , 584-593
- https://doi.org/10.1109/43.55187
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
- A reconvergent fanout analysis for efficient exact fault simulation of combinational circuitsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Advanced automatic test pattern generation and redundancy identification techniquesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Testability-Driven Random Test-Pattern GenerationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1987
- On fault modeling for dynamic MOS circuitsPublished by Association for Computing Machinery (ACM) ,1986
- On the Complexity of Estimating the Size of a Test SetIEEE Transactions on Computers, 1984
- On Random Pattern Test LengthIEEE Transactions on Computers, 1984
- STAFAN: An Alternative to Fault SimulationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1984
- Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-TestIBM Journal of Research and Development, 1983
- Polynomially Complete Fault Detection ProblemsIEEE Transactions on Computers, 1975
- Mathematische OptimierungPublished by Springer Nature ,1975