Abstract
Experimental results on the reduction of chromatic aberration in the magnetic electron microscope are described. It is proved that the chromatic field aberration can be completely compensated by a proper combination of two lenses with adequately designed pole pieces and the voltage stabilization tolerance is greatly improved. Micrographs with a resolution of about 5 mμ can be obtained even under a voltage fluctuation as large as ΔE/E=1.10−2.

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