Mechanism of Fatigue in Ferroelectric Thin Films
- 16 October 1992
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 133 (2) , 565-573
- https://doi.org/10.1002/pssa.2211330242
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
- Degradation of dielectric ceramicsMaterials Science and Engineering: A, 1989
- Electrical Conduction Mechanisms of Barium-Titanate-Based Thick-Film CapacitorsIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1987
- Electron microscopic studies of ferroelectric crystalsFerroelectrics, 1986
- Maxwell-wagner relaxation and degradation of SrTiO3 and BaTiO3 ceramicsFerroelectrics, 1986
- Aging of Strontium Barium Niobate and PLZT ceramicPhysica Status Solidi (a), 1980
- Disorder in ferroelectrics: Relaxation effectsFerroelectrics, 1977
- Physics of ferroelectric ceramics used in electronic devicesFerroelectrics, 1976
- Effects of grain size on the electrical properties of PLZT ceramicsFerroelectrics, 1974
- Effects of Grain Size and Porosity on Electrical and Optical Properties of PLZT CeramicsJournal of the American Ceramic Society, 1973
- Characterization of Freeze‐Dried Al2O3and Fe2O3Journal of the American Ceramic Society, 1970