A microwave noise and gain parameter test set
- 1 January 1978
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- The determination of device noise parametersProceedings of the IEEE, 1969
- Available Power Gain, Noise Figure, and Noise Measure of Two-Ports and Their Graphical RepresentationsIEEE Transactions on Circuit Theory, 1966
- The noise performance of microwave transistorsIEEE Transactions on Electron Devices, 1966