The random testability of the n-input AND gate
- 13 November 2005
- book chapter
- Published by Springer Nature
- p. 488-498
- https://doi.org/10.1007/bfb0020823
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Random allocations and probabilistic languagesPublished by Springer Nature ,1988
- Testability-Driven Random Test-Pattern GenerationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1987
- On computing optimized input probabilities for random testsPublished by Association for Computing Machinery (ACM) ,1987
- Parameterized Random TestingPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1984
- Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-TestIBM Journal of Research and Development, 1983