Slow-Scan CCD Camera Analysis of Electron Diffraction and High-Resolution Micrographs of Zeolite TPA/ZSM-5

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Abstract
We demonstrate herein the application of a slow-scan CCD camera attached to a 400 kV high-resolution transmission electron microscope for improvement in the experimental resolution of contrast details in the synthetic zeolite structure ZSM-5 (MFI). The additionally resolved contrast features are shown to be due to the presence of organic TPA+ (tetrapropylammonium) ions in the structural cages (channels) of the atomic framework of this material. The improvement in the amount and quality of structural detail through the use of the CCD camera is also shown by a comparison of a Fourier synthesis, made by using the observed electron diffraction intensities, with another one calculated by using a structure model based on X-ray measurements. The phases for both Fourier maps were calculated from the X-ray data. A comparison of the two Fourier calculations results in a good agreement. R-factors based on the normalized diffraction intensities have also been employed to evaluate the result of the structure analysis.

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