Structural change due to thermal treatment and dielectric properties of anodic oxides films of bismuth
- 1 June 1993
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 229 (2) , 156-162
- https://doi.org/10.1016/0040-6090(93)90358-v
Abstract
No abstract availableKeywords
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