Chemical Etching Studies and Transmission Electron Microscopy of Silicon Carbide
- 1 September 1963
- journal article
- Published by Springer Nature in Nature
- Vol. 199 (4898) , 1054-1056
- https://doi.org/10.1038/1991054a0
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Crystallographic Imperfections in Epitaxially Grown SiliconJournal of Applied Physics, 1962
- Method of preparing Si and Ge specimens for examination by transmission electron microscopyBritish Journal of Applied Physics, 1962