Terracing of (100) Si with one mask and one etching step using misaligned V-grooves

Abstract
By using narrowly spaced V-grooves slightly misaligned to the [110]-direction, multilevel terracing can be obtained using one mask and one wet etching step only. Etching in the vertical direction is locally delayed until the ridges between the V-grooves are fully underetched. The method is demonstrated in KOH and TMAH (tetramethyl ammonium hydroxide) etchants and the dependence of angular misalignment on height and surface smoothness are investigated.

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