Radiation Damage Testing Of Transistors For SSC Front-end Electronics
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Rad-Hard Electronics Development Program for SSC Liquid-Argon CalorimetersPublished by Springer Nature ,1990
- Fast neutron damage in silicon detectorsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1989
- The Effects of Radiation on Electronic SystemsPublished by Springer Nature ,1986