Characterization of the topography of vacuum-deposited films 1: Light scattering
- 15 October 1986
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 25 (20) , 3602-3609
- https://doi.org/10.1364/ao.25.003602
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 14 references indexed in Scilit:
- Surface roughness measurements of low-scatter mirrors and roughness standardsApplied Optics, 1984
- Comparison Of Two Common Methods Of Surface Topography EvaluationOptical Engineering, 1982
- Stylus profiling instrument for measuring statistical properties of smooth optical surfacesApplied Optics, 1981
- Optical techniques for on-line measurement of surface topographyPrecision Engineering, 1981
- The measurement of surface texture and topography by differential light scatteringWear, 1979
- Vector Scattering TheoryOptical Engineering, 1979
- Relation between the angular dependence of scattering and the statistical properties of optical surfacesJournal of the Optical Society of America, 1979
- Measurement of the rms roughness, autocovariance function and other statistical properties of optical surfaces using a FECO scanning interferometerApplied Optics, 1976
- Optical and Mechanical RMS Surface Roughness ComparisonApplied Optics, 1971