Rietveld refinement of Debye–Scherrer synchrotron X-ray data from Al2O3
- 1 April 1987
- journal article
- research article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 20 (2) , 79-83
- https://doi.org/10.1107/s0021889887087090