Multilayers observed by transmission electron microscopy
- 1 July 1983
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 105 (1) , 71-74
- https://doi.org/10.1016/0040-6090(83)90332-2
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Reflective multilayer coatings for the far uv regionApplied Optics, 1976
- Multilayer interference mirrors for the XUV range around 100 eV photon energyOptics Communications, 1976
- X-Ray Diffraction by Multilayered Thin-Film Structures and Their DiffusionJournal of Applied Physics, 1967
- An X-Ray Method of Determining Rates of Diffusion in the Solid StateJournal of Applied Physics, 1940
- Versuche über die Reflexion von Röntgenstrahlen an einem künstlich hergestellten Schichtenkörper. (Mit 5 Figuren)Annalen der Physik, 1930